BayesFT: Bayesian Optimization for Fault Tolerant Neural Network Architecture

Published in 2021 58th ACM/IEEE Design Automation Conference (DAC), 2021

Experiment:

Neural Network

Object Detect

Citation:

Ye N, Mei J, Fang Z, et al. BayesFT: Bayesian Optimization for Fault Tolerant Neural Network Architecture[C]//2021 58th ACM/IEEE Design Automation Conference (DAC). IEEE, 2021: 487-492.